We Can Figure This Out.org
Virtual Lab: Atomic Force Microscope (AFM)
 University of Virginia
             
 
© 2003-Present, John C. Bean
 
To scan across the sample’s surface, we need horizontal movement in two perpendicular directions.

X movement is produced by energizing the right electromagnetic twice as strongly as the top electromagnet.

As the right and top legs are pulled toward the magnets, the tripod rotates around the twisting spring at the base of the left leg.

 
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